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- eee-239 - advanced-vlsi-design-for-test-ii
California State University-Sacramento Course Info
Sacramento, California
Course Info
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EEE 239
Advanced VLSI Design-For-Test II
Advanced topics in VLSI testing and Design-For-Test applications. Memory-specific test methodology and special features of memory designs employed in high volume manufacturing for improved testability, yield, and reliability. VLSI failure modes, their detection and prevention. Application of trim, redundancy, wear-leveling, and error correction.
Units: 3.0
Prerequisites:
EEE 238 - Advanced VLSI Design-For-Test I