ECGR 4182

Digital System Testing

Introduction to VLSI testing, test process and automatic test equipment, test economics and product quality, test economics, fault modeling, logic and fault simulation, testability measures, combinational and sequential circuit test generation, memory test, analog test, delay test, IDDQ test, design for testability, built-in self test, boundary scan, analog test bus, system test and core test.

Units: 3.0